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Updated: Jan 24, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
High-throughput X-ray total scattering measurement system at BL04B2 of SPring-8
Hiroki Yamada1, Seiya Shimono1, Shogo Kawaguchi1
1Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
None:
X-ray total scattering is widely used for analyzing pair distribution functions (PDFs) to elucidate the local structure of materials. For achieving high-throughput PDF analysis, a beamline monochromator and an experimental system were updated at BL04B2 of SPring-8. The system consists of a diffractometer and 2D area detectors, which cover a wide Q range of 0.2-27 Å-1 at a photon energy of 113 keV, with a temperature control capability between 100 and 1100 K. The typical measurement time is reduced to ∼10 min per sample, which is more than ten times faster than the conventional setup. This system enables efficient structural analysis of various types of materials such as liquids, glasses and nanocrystals while yielding abundant measurement data for use in materials science.
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