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Complementary Metamaterial Sensor for Nondestructive Evaluation of Dielectric Substrates

Tanveer Ul Haq1, Cunjun Ruan2,3, Xingyun Zhang4

  • 1School of Electronic and Information Engineering, Beihang University, Beijing 100191, China. tanveerulhaq@buaa.edu.cn.

Sensors (Basel, Switzerland)
|May 10, 2019
PubMed

Keywords:
CCSRcomplementary metamaterial sensormaterial under testnondestructive evaluationpermittivitytranscendental equation

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