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Multiscale image denoising using goodness-of-fit test based on EDF statistics
Khuram Naveed1, Bisma Shaukat1, Shoaib Ehsan2
1Department of Electrical and Computer Engineering, COMSATS University Islamabad (CUI), Islamabad, Pakistan.
Two new image denoising algorithms use goodness of fit (GoF) tests on wavelet coefficients at multiple scales. These methods effectively distinguish between noise and signal for improved image quality.
Area of Science:
- Digital Image Processing
- Signal Processing
- Statistical Signal Analysis
Background:
- Image noise significantly degrades visual quality and hinders subsequent analysis.
- Traditional denoising methods often struggle to preserve image details while effectively removing noise.
- Wavelet transforms are widely used for image denoising due to their ability to represent signals at different scales and orientations.
Purpose of the Study:
- To introduce two novel image denoising algorithms.
- To leverage goodness of fit (GoF) tests for robust noise identification.
- To enhance image quality by accurately separating signal from noise.
Main Methods:
- Applying GoF tests locally on wavelet coefficients obtained from Discrete Wavelet Transform (DWT) and Dual Tree Complex Wavelet Transform (DT-CWT).
- Formulating image denoising as a binary hypothesis testing problem.
- Utilizing the empirical distribution function (EDF) for GoF testing to decide between noise and signal presence.
Main Results:
- The proposed algorithms demonstrate effective noise removal at multiple image scales.
- Local GoF testing on wavelet coefficients allows for precise identification of noisy regions.
- Validation against state-of-the-art methods indicates competitive or superior denoising performance.
Conclusions:
- The novel GoF-based algorithms offer a promising approach to image denoising.
- Employing hypothesis testing with EDF-based GoF tests provides a robust framework for noise-signal discrimination.
- These methods contribute to advancing the field of digital image processing and restoration.
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