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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Transmission Electron Microscopy01:15

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Immunogold Electron Microscopy01:20

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Immunoelectron microscopy utilizes immunogold labeling of endogenous proteins with specific antibodies to detect and localize these proteins in cells and tissues. The procedure provides insights into the distribution and quantification of protein under different stimulation conditions offering clues about their functions. Conjugating highly electron-dense gold particles with primary or secondary antibodies allow antigen detection on and within cells, with high resolution and specificity.
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Cryo-electron Microscopy01:28

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Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
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The Energies of Atomic Orbitals03:21

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In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Updated: Jan 25, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials.

Michael J Zachman1, Jordan A Hachtel1, Juan Carlos Idrobo1

  • 1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.

Angewandte Chemie (International Ed. in English)
|May 14, 2019
PubMed
Summary
This summary is machine-generated.

Emerging electron microscopy techniques overcome limitations in analyzing interfaces, enabling the study of functional properties beyond atomic structure. These advanced methods offer new insights into material interfaces.

Keywords:
4D electron microscopySTEMcryo-electron microscopyinterfacesmonochromated EELS

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Area of Science:

  • Surface science and analytical chemistry.
  • Materials science and nanotechnology.
  • Advanced microscopy and spectroscopy.

Background:

  • Interfaces are crucial in chemistry, but their localized nature demands high spatial resolution for characterization.
  • Current techniques like scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS) offer atomic resolution but cannot measure functional properties (e.g., vibrational modes, charge transfer) or analyze liquids and room-temperature samples.

Purpose of the Study:

  • To outline emerging electron microscopy techniques that address the limitations of current methods for interface characterization.
  • To highlight recent studies demonstrating the capabilities of these new techniques.
  • To propose a future vision for combining these techniques for comprehensive interface analysis.

Main Methods:

  • Review and discussion of emerging electron microscopy techniques.
  • Analysis of recent case studies showcasing these advanced methods.
  • Conceptualization of synergistic combinations of techniques for in situ and dynamic studies.

Main Results:

  • Emerging electron microscopy methods are overcoming previous limitations in interface characterization.
  • These techniques enable the study of functional properties and dynamic behavior at interfaces.
  • Recent studies demonstrate the successful application of these advanced characterization tools.

Conclusions:

  • Advanced electron microscopy techniques are expanding the scope of interface analysis.
  • Combining these methods with in situ approaches will provide unprecedented insights into functional interfaces.
  • Future research directions focus on dynamic and functional characterization of interfaces.