Related Experiment Video
Updated: Jan 24, 2026

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
Published on: August 26, 2015
Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light
David Scott Coburn1, Evgeny Nazaretski1, Weihe Xu1
1National Synchrotron Light Source-II, Brookhaven National Laboratory, Upton, New York 11973, USA.
Abstract:
A transmission X-ray microscope has been designed and commissioned at the 18-ID Full-field X-ray Imaging beamline at the National Synchrotron Light Source II. This instrument operates in the 5-11 keV range, and, with the current set of optics, is capable of 30 nm spatial resolution imaging, with a field of view of about 40 μm. For absorption contrast, the minimum exposure time for a single projection image is about 20 ms and an entire 3D tomography data set can be acquired in under 1 min. The system enables tomographic reconstructions with sub-50 nm spatial resolution without the use of markers on the sample or corrections for rotation run-outs.
More Related Videos
10:32Sample Preparation and Transfer Protocol for In-Vacuum Long-Wavelength Crystallography on Beamline I23 at Diamond Light Source
Published on: April 23, 2021
10:39Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Related Concept Videos
Design of Transmission Shafts
Transmission Line Design Considerations
Sources of Self-Esteem II: Performance Feedback
Design of Transmission Shafts - Stress Analysis
National Nursing Organizations I
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...