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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Atomic Orbitals02:44

Atomic Orbitals

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An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
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Intermolecular Forces03:13

Intermolecular Forces

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Atoms and molecules interact through bonds (or forces): intramolecular and intermolecular. The forces are electrostatic as they arise from interactions (attractive or repulsive) between charged species (permanent, partial, or temporary charges) and exist with varying strengths between ions, polar, nonpolar, and neutral molecules. The different types of intermolecular forces are ion–dipole, dipole–dipole, hydrogen bonds, and dispersion; among these, dipole–dipole, hydrogen...
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The Energies of Atomic Orbitals03:21

The Energies of Atomic Orbitals

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In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Intermolecular vs Intramolecular Forces03:00

Intermolecular vs Intramolecular Forces

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Intermolecular forces (IMF) are electrostatic attractions arising from charge-charge interactions between molecules. The strength of the intermolecular force is influenced by the distance of separation between molecules. The forces significantly affect the interactions in solids and liquids, where the molecules are close together. In gases, IMFs become important only under high-pressure conditions (due to the proximity of gas molecules). Intermolecular forces dictate the physical properties of...
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Atomic Structure01:33

Atomic Structure

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Overview
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Live Cell Response to Mechanical Stimulation Studied by Integrated Optical and Atomic Force Microscopy
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Live Cell Response to Mechanical Stimulation Studied by Integrated Optical and Atomic Force Microscopy

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Atomic force microscopy with integrated on-chip interferometric readout.

Michal Zawierta1, Roger D Jeffery1, Gino Putrino1

  • 1The University of Western Australia, Perth, WA 6009, Australia.

Ultramicroscopy
|June 28, 2019
PubMed
Summary
This summary is machine-generated.

This study introduces a novel atomic force microscopy (AFM) probe with integrated silicon photonics for high-resolution, miniaturized imaging. The new optical interferometric readout overcomes limitations of traditional methods, enabling ultrafast multiprobe-array AFM imaging.

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Area of Science:

  • Nanotechnology
  • Materials Science
  • Physics

Background:

  • Atomic Force Microscopy (AFM) commonly uses optical beam deflection (OBD) for readout, achieving high resolution but limited by probe size.
  • Existing miniaturization efforts (on-chip electrical readouts) often compromise measurement sensitivity.
  • A need exists for cost-effective AFM solutions balancing sensitivity, miniaturization, and scalability.

Purpose of the Study:

  • To develop a miniaturized AFM probe with integrated on-chip optical interferometric readout.
  • To combine sub-nanometer resolution with on-chip miniaturization and array scalability.
  • To enable ultrafast multiprobe-array AFM imaging.

Main Methods:

  • Developed an AFM probe utilizing silicon photonics with an integrated optical interferometric readout.
  • Employed an on-chip photonics waveguide to monitor cantilever deflection by measuring separation from an interrogating grating.
  • Integrated the novel probe into a Digital Instruments D3000 AFM system.

Main Results:

  • Achieved sub-nanometer AFM topography imaging on reference samples.
  • Demonstrated a Root Mean Square (RMS) static AFM noise level of 19 picometers (pm), significantly outperforming the standard OBD configuration (51 pm).
  • Attained a deflection noise density (DND) of 36 femtometers per Hertz (fm/√Hz), indicating shot-noise-limited performance.

Conclusions:

  • The developed AFM probe offers sub-nanometer resolution, on-chip miniaturization, and array scalability.
  • This technology overcomes limitations of traditional OBD and electrical readout methods.
  • Enables advanced applications like ultrafast multiprobe-array AFM imaging with superior sensitivity.