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High-speed atomic force microscope with a combined tip-sample scanning architecture
1State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China.
The Review of Scientific Instruments
|July 1, 2019
Summary
A novel high-speed atomic force microscope (HS-AFM) achieves 100 Hz line rates using a tip-sample combined scanning architecture. This advanced HS-AFM design enhances dynamic performance and sample handling capabilities.
Area of Science:
- Surface Science
- Microscopy Technology
- Nanotechnology
Background:
- Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
- Conventional AFMs often face limitations in scanning speed and sample manipulation.
- High-speed imaging is essential for observing dynamic processes at the nanoscale.
Purpose of the Study:
- To develop and present a novel high-speed atomic force microscope (HS-AFM).
- To improve scanning speed and dynamic performance compared to existing AFM systems.
- To enable robust imaging of larger and heavier samples.
Main Methods:
- Implemented a tip-sample combined scanning architecture.
- Separated the X-scanner (sample stage) from the AFM head containing Y and Z scanners.
- Enhanced the optical beam deflection method for wide-range probe tracking.
- Utilized a novel probe holder for easy probe exchange and alignment.
Main Results:
- Achieved a line rate of up to 100 Hz using proportional-integral-derivative control and linear driving.
- Demonstrated improved dynamic performance and carrying capacity due to scanner separation.
- Confirmed the system's capability to handle samples up to several centimeters in size and over 40 g in mass.
Conclusions:
- The presented HS-AFM design significantly enhances scanning speed.
- The architecture offers superior dynamic performance and sample handling.
- This technology advances the potential for real-time nanoscale observations and material analysis.
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