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Updated: Jan 22, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
G Zeraouli1, G Gatti1, A Longman2
1CLPU, Centro de Laseres Pulsados, Building M5, Science Park, Calle Adaja 8, 37185 Villamayor, Salamanca, Spain.
A new Kirkpatrick-Baez (KB) microscope prototype uses flexible silicon wafers for adjustable X-ray focusing. This adaptable X-ray optics system demonstrates broadband spectral tunability for laser-driven experiments.
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