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Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
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Topography Measurements Using High Mass Resolution Time-of-Flight Secondary Ion Mass Spectrometry: Application to
Alice Bejjani1, Manale Noun1, Serge Della-Negra2
1Research and Development Department , Lebanese Atomic Energy Commission-CNRS , P.O. Box 11-8281, Beirut 1107 2260 , Lebanon.
Analytical Chemistry
|July 2, 2019
Summary
This study introduces a novel method using time-of-flight secondary ion mass spectrometry (TOF-SIMS) to measure microscale height topography. The technique accurately determines height differences on surfaces like banknotes, offering enhanced material analysis.
Area of Science:
- Materials Science
- Analytical Chemistry
- Surface Science
Background:
- Accurate microscale height topography measurement is crucial for material characterization.
- Traditional methods can be limited in scope or require complex sample preparation.
- Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful surface analysis technique.
Purpose of the Study:
- To develop and validate an unconventional TOF-SIMS approach for microscale height topography determination.
- To investigate the influence of various experimental parameters on the accuracy of height measurements.
- To demonstrate the application of this method for analyzing banknote paper topography.
Main Methods:
- Utilized TOF-SIMS by measuring the time-of-flight difference of secondary ions from varying heights.
- Employed a simple model of two Post-it sheets to calibrate and test the method.
- Investigated the impact of ion beam orientation, electron beam azimuth, and extraction gap adjustments.
- Explored the effect of analyzer acceptance energy and component energies on measurement outcomes.
Main Results:
- Successfully measured height differences ranging from 20 to 180 μm.
- Demonstrated that measurements are independent of topography orientation and extraction gap settings.
- Confirmed that analyzer acceptance energy influences results, requiring corresponding component energy adjustments.
- The method allows for simultaneous chemical composition analysis of different surface areas.
Conclusions:
- The developed TOF-SIMS method provides a reliable and unconventional approach for microscale height topography measurement.
- This technique offers an advantage over traditional methods by enabling concurrent chemical analysis.
- The findings have potential applications in the detailed characterization of materials like security paper.
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