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Updated: Jan 22, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
Commissioning of a photoelectron spectrometer for soft X-ray photon diagnostics at the European XFEL
Joakim Laksman1, Jens Buck2, Leif Glaser2
1European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.
Abstract:
Commissioning and first operation of an angle-resolved photoelectron spectrometer for non-invasive shot-to-shot diagnostics at the European XFEL soft X-ray beamline are described. The objective with the instrument is to provide the users and operators with reliable pulse-resolved information regarding photon energy and polarization that opens up a variety of applications for novel experiments but also hardware optimization.
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