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Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator

Donggun Lee1, Jun-Woo Park1, Nam-Kwang Cho1

  • 1Program in Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul, 08826, Republic of Korea.

Scientific Reports
|July 18, 2019
PubMed

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