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Layer Microdissection of Tricuspid Valve Leaflets for Biaxial Mechanical Characterization and Microstructural Quantification
Published on: February 10, 2022
Sabyasachi Saha1, Deepak Kumar1, Chandan K Sharma1
1Defence Metallurgical Research Laboratory, PO Kanchanbagh, Hyderabad 500058, India.
Micro-cracking in Gallium Nitride (GaN) films grown on Silicon Carbide (SiC) is linked to the Aluminum Nitride (AlN) nucleation layer. A rough AlN surface induces tensile stress, causing GaN film cracking.
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