Related Experiment Video

Updated: Jan 20, 2026

Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles
11:16

Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles

Published on: August 7, 2016

10.1K

Probing Crystal Dislocations in a Micrometer-Thick GaN Film by Modern High-Voltage Electron Microscopy

Kazuhisa Sato1,2, Hidehiro Yasuda1,2

  • 1Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.

ACS Omega
|August 29, 2019
PubMed

More Related Videos

Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy07:20

Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy

Published on: January 20, 2023

3.3K
Scanning-probe Single-electron Capacitance Spectroscopy10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.4K

Related Concept Videos

Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles11:16

Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles

A method is described whereby quantum dot (QD) nanoparticles can be used for correlative immunocytochemical studies of epoxy embedded human pathology tissue. We employ commercial antibody fragment conjugated QDs that are visualized by widefield fluorescence light microscopy and transmission electron...
10.1K
Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy07:20

Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy

Utilizing the volume change of Si nanoparticles during (de)lithiation, the present protocol describes a screening method of potential coatings for all-solid-state batteries using in situ transmission electron...
3.3K
Scanning Electron Microscopy (SEM)11:41

Scanning Electron Microscopy (SEM)

Source: Laboratory of Dr. Andrew J. Steckl — University of Cincinnati
A scanning electron microscope, or SEM, is a powerful microscope that uses electrons to form an image. It allows for imaging of conductive samples at magnifications that cannot be achieved using traditional microscopes. Modern light microscopes can achieve a magnification of ~1,000X, while typical SEM can reach magnifications of more than 30,000X. Because the SEM doesn’t use light to create images, the...
90.3K
Scanning-probe Single-electron Capacitance Spectroscopy10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor...
13.4K
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic...
12.2K
Preparation of Large-area Vertical 2D Crystal Hetero-structures Through the Sulfurization of Transition Metal Films for Device Fabrication08:50

Preparation of Large-area Vertical 2D Crystal Hetero-structures Through the Sulfurization of Transition Metal Films for Device Fabrication

Through the sulfurization of pre-deposited transition metals, large-area and vertical 2D crystal hetero-structures can be fabricated. The film transferring and device fabrication procedures are also demonstrated in this...
9.6K