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Updated: Jan 20, 2026
Semiconductors and Characteristics of P-N Junctions
Published on: April 30, 2023
Torsten Stiehm1, Robert Schneider1, Johannes Kern1
1Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany.
Researchers developed a new spectroscopy method to precisely measure nonlinear optical properties of 2D semiconductors. This technique calibrates measurements, enabling detailed analysis of excitonic resonances in materials like MoS2 and WS2.
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