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Measuring Material Microstructure Under Flow Using 1-2 Plane Flow-Small Angle Neutron Scattering
Published on: February 6, 2014
A project of advanced solid-state neutron polarizer for PF1B instrument at Institut Laue-Langevin
A K Petukhov1, V V Nesvizhevsky1, T Bigault1
1Institut Max von Laue-Paul Langevin, 71 avenue des Martyrs, Grenoble F-38042, France.
Abstract:
Among polarizers based on the neutron reflection from Super-Mirrors (SMs), solid-state neutron-optical devices have many advantages. The most relevant is the 5-10 times smaller size along the neutron beam direction compared to more traditional air-gap devices. An important condition for a good SM polarizer is the matching of the substrate SLD (Scattering Length Density) with the SM coating SLD for the spin-down component. For traditional Fe/Si SM on the Si substrate, this SLD step is positive when a neutron goes from the substrate to the SM, which leads to a significant degradation of the polarizer performance in the small Q region. This can be solved by replacing single-crystal Si substrates by single-crystal sapphire or quartz substrates. The latter shows a negative SLD step for the spin-down neutron polarization component at the interface with Fe and, therefore, avoid the total reflection regime in the small Q region. In order to optimize the polarizer performance, we formulate the concept of sapphire V-bender. We perform ray-tracing simulations of sapphire V-bender, compare results with those for traditional C-bender on Si, and study experimentally V-bender prototypes with different substrates. Our results show that the choice of substrate material, polarizer geometry, as well the strength and quality of magnetizing field have dramatic effect on the polarizer performance. In particular, we compare the performance of polarizer for the applied magnetic field strength of 50 mT and 300 mT. Only the large field strength (300 mT) provides an excellent agreement between the simulated and measured polarization values. For the double-reflection configuration, a record polarization >0.999 was obtained in the neutron wavelength band of 0.3-1.2 nm with only 1% decrease at 2 nm. Without any collimation, the polarization averaged over the full outgoing capture spectrum, 0.997, was found to be equal to the value obtained previously using only a double polarizer in the "crossed" (X-SM) geometry. These results are applied in a full-scale polarizer for the PF1B instrument.
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