X-ray diffraction in superabsorbing crystals: absorption intrinsic width

Area of Science:

• Materials Science
• Crystallography
• Condensed Matter Physics

Background:

• X-ray diffraction (XRD) is a key materials characterization technique.
• Advancements in synchrotrons necessitate simpler XRD formulations for new techniques.
• Soft resonant X-ray diffraction experiences significant X-ray attenuation.

Purpose of the Study:

• To derive a simplified mathematical formulation for X-ray diffraction profiles in superabsorbing crystals.
• To analyze the diffraction profiles of parallel plate crystals with high linear absorption.
• To provide new perspectives for soft resonant X-ray diffraction analysis.

Main Methods:

• Derivation of an expression for X-ray diffraction profiles in superabsorbing crystals.
• Computation of diffraction profiles as a function of crystal size.
• Comparison with kinematical theory and Laue dynamical theory.

Main Results:

• For thin or low-absorption crystals, profiles match kinematical theory.
• For thick crystals, an absorption intrinsic profile (Lorentzian) is observed.
• The absorption intrinsic width is proportional to the linear absorption coefficient.

Conclusions:

• The derived formulation simplifies the analysis of X-ray diffraction in superabsorbing crystals.
• This work offers new insights into soft resonant X-ray diffraction.
• The formulation bridges kinematical and dynamical theories for highly absorbing materials.