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Updated: Jan 20, 2026

$Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction$

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

A new method for locating Kikuchi bands in electron backscatter diffraction patterns.

Yongsheng Zhang¹, Shangqiang Fang², Chucheng Lin¹

¹The State Key Lab of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai, China.

Microscopy Research and Technique

|September 7, 2019

Summary

This study presents a new image processing technique for electron backscatter diffraction (EBSD) to precisely locate Kikuchi bands and zone axes, improving crystal structure analysis accuracy.

Keywords:

Kikuchi bands edge detection electron backscatter diffraction image processing

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$Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction$

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Published on: April 1, 2017

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Published on: August 22, 2017

Area of Science:

Materials Science
Crystallography
Image Processing

Background:

Electron Backscatter Diffraction (EBSD) is crucial for determining crystal structure, orientation, and phase content.
Accurate band position and zone axes data are essential for reliable EBSD analysis.
Existing methods may face limitations in precision and ease of data acquisition.

Purpose of the Study:

To introduce a novel image processing method for precise Kikuchi band and pole detection in EBSD.
To enhance the accuracy of lattice plane and zone axes indexing from EBSD patterns.
To provide a more reliable approach for calculating angles between zone axes.

Main Methods:

Initial detection of Kikuchi lines using pattern rotation and gray gradient calculation.
Final band position definition employing Hough transform and Gaussian function.
Precise indexing of lattice planes and zone axes based on identified band positions.

Main Results:

The new method accurately locates Kikuchi bands and poles.
Lattice plane and zone axes indices are obtained with high precision.
A maximum error of 8.07% was observed for a single-crystal silicon sample, demonstrating method accuracy.

Conclusions:

The developed image processing technique significantly improves the accuracy of EBSD data.
This method offers a precise and straightforward way to obtain crystallographic information.
The findings contribute to more reliable material characterization using EBSD.