Microsecond time-resolved X-ray diffraction for the investigation of fatigue behavior during ultrasonic fatigue

T Ors1, N Ranc1, M Pelerin2

  • 1Laboratoire PIMM, CNRS, ENSAM, HESAM, 151 Boulevard de l'Hôpital, 75013 Paris, France.

Summary

Researchers developed a novel time-resolved X-ray diffraction technique to measure elastic strain and stress in materials during ultrasonic fatigue. This method achieves microsecond resolution, revealing detailed material responses under cyclic loading.

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