Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has gradually becomes indispensable tool to investigate local piezoelectric and ferroelectric properties in diverse material systems. However, numerous reports have shown that the PFM signal can originate from several non-piezoelectric origins. Among them, because the electrostatic interaction between the AFM tip/cantilever and sample surface can be readily involved, it can be the most important factor during PFM measurement. In particular, in materials with relatively low piezoelectricity, the situation can be more significant because the PFM signals from weak piezoelectricity can be hidden or buried by the electrostatic interactions. Herein, we examined the significance of the electrostatic interactions induced by the surface potential in PFM. Using piezoelectric and non-piezoelectric materials, we examined how the surface potential-dependent electrostatic interactions can significantly affect the PFM signal. We observed that the electrostatically induced PFM amplitude have a linear relationship with the magnitude of surface potential when the instrumental noise floor is properly considered. Our results demonstrate that electrostatic interactions can be significant and their recognition and minimization are essential during PFM and other AFM-based measurements.