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Updated: Jan 19, 2026
Cell Imaging Using Total Internal Reflection Fluorescence Microscopy
Published on: June 17, 2025
Efficiency of Gaussian light beam transformation into a waveguide mode of a plane dielectric layer under frustrated
Abstract:
On the basis of the 2D analytic theory of the phenomenon of frustrated total internal reflection for a Gaussian light beam, produced by the authors in the previous paper [J. Opt. Soc. Am. A32, 843 (2015)JOAOD60740-323210.1364/JOSAA.32.000843], the efficiency of waveguide mode excitation in a plane dielectric layer using a prism is considered. The influence of the initial beam half-width, of the thickness of a waveguide, and of its displacement from the prism base on excitation efficiency is investigated. The conditions of maximal efficiency are established.
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