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Updated: Jan 19, 2026

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Sensing fabrication errors in diffraction gratings using high dynamic range imaging.

Sofia C Corzo-Garcia, Johannes A Soons, Ulf Griesmann

    Optics Express
    |September 13, 2019
    PubMed
    Summary
    This summary is machine-generated.

    We developed a simple instrument using a charge-coupled device (CCD) camera to detect fabrication errors in diffraction gratings. This high dynamic range imaging method identifies subtle grating defects missed by microscopy.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Metrology

    Background:

    • Diffraction gratings are crucial optical components with stringent quality requirements.
    • Detecting subtle fabrication errors is essential for grating performance.
    • Existing microscopic techniques have limitations in identifying certain types of defects.

    Purpose of the Study:

    • To design and demonstrate a simple, cost-effective instrument for identifying and characterizing fabrication errors in diffraction gratings.
    • To achieve high dynamic range detection of scattered light from gratings.
    • To overcome limitations of traditional microscopic inspection methods.

    Main Methods:

    • Utilized an uncooled charge-coupled device (CCD) camera for light detection.
    • Employed a high dynamic range imaging process to analyze scattered light.
    • Focused on detecting light in the focal plane of a lens positioned relative to the grating under test.

    Main Results:

    • The instrument achieved a dynamic range of approximately nine orders of magnitude.
    • Successfully identified small, periodic fabrication errors in test diffraction gratings.
    • Demonstrated superior sensitivity compared to conventional microscopic techniques for specific defect types.

    Conclusions:

    • The developed instrument offers a simple and effective solution for detecting fabrication errors in diffraction gratings.
    • High dynamic range imaging with a CCD camera provides a powerful tool for grating metrology.
    • This method enhances the ability to identify critical grating defects that impact optical performance.