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Updated: May 8, 2026

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Published on: December 15, 2015
Response to Comment on "Spin coating epitaxial films".
Meagan V Kelso1, Naveen K Mahenderkar1, Qingzhi Chen2
1Department of Materials Science and Engineering and Graduate Center for Materials Research, Missouri University of Science and Technology, Rolla, MO 65409, USA.
This study addresses claims about spin-coated films, refuting the idea that background x-ray intensity indicates randomly oriented grains. Evidence suggests the films are not randomly oriented, contrary to previous assertions.
Area of Science:
- Materials Science
- Crystallography
Background:
- A previous study by Lu and Tang questioned the epitaxial nature of spin-coated films.
- They attributed background intensity in x-ray pole figures to randomly oriented grains.
Purpose of the Study:
- To refute the claim that spin-coated films lack epitaxial quality.
- To provide evidence against the interpretation of background intensity as randomly oriented grains.
Main Methods:
- Analysis of 2θ x-ray diffraction patterns.
- Examination of x-ray pole figures for spin-coated films.
- Comparison of background intensity with single-crystal substrates.
Main Results:
- No evidence of randomly oriented grains was found in the 2θ x-ray patterns.
- The background intensity in pole figures was comparable to that of single-crystal substrates.
- This finding contradicts the assumption of randomly oriented grains.
Conclusions:
- The interpretation of background intensity in x-ray pole figures by Lu and Tang is inconsistent with our data.
- The spin-coated films exhibit characteristics that do not support the claim of being non-epitaxial due to random grain orientation.
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