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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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SAR and Optical Data Comparison for Detecting Co-Seismic Slip and Induced Phenomena during the 2018 Mw 7.5 Sulawesi

Marco Polcari1, Cristiano Tolomei2, Christian Bignami3

  • 1Istituto Nazionale di Geofisica e Vulcanologia, Via di Vigna Murata 605, 00143 Rome, Italy. marco.polcari@ingv.it.

Sensors (Basel, Switzerland)
|September 22, 2019
PubMed

Keywords:
Palu-Koro faultSAR InterferometrySAR dataSub-pixel correlationSulawesi earthquakeixel Offset Trackingoptical data

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