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Related Experiment Video

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High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
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Fast 3D Surface Measurement with Wrapped Phase and Pseudorandom Image.

Xing Liu1, Dong He2, Hao Hu3

  • 1School of Marine Science and Technology, Northwestern Polytechnical University, Xi'an 710072, China. xingliu86@nwpu.edu.cn.

Sensors (Basel, Switzerland)
|September 29, 2019
PubMed
Summary

This study introduces a novel 3D surface measurement method using wrapped phase and pseudorandom images, significantly improving speed without phase unwrapping. It achieves high accuracy for fast 3D object scanning.

Keywords:
3D measurementcomputer visionfringe projectionphase unwrapping

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Area of Science:

  • Optics and Photonics
  • Computer Vision
  • Metrology

Background:

  • Accurate and high-speed three-dimensional (3D) surface measurement is critical for diverse applications.
  • Traditional 3D measurement techniques often face challenges in balancing speed and accuracy, particularly concerning phase unwrapping.

Purpose of the Study:

  • To present a novel method for 3D surface measurement that enhances speed and accuracy.
  • To develop an experimental system that eliminates the need for phase unwrapping, reducing processing time.

Main Methods:

  • A wrapped phase and pseudorandom image method was developed.
  • The system utilizes the epipolar constraint between a camera and a projector to identify candidate 3D points.
  • Pseudorandom images are employed to eliminate false points, ensuring accurate 3D reconstruction.

Main Results:

  • The proposed method significantly reduces the length of image sequences and improves pattern projection and image acquisition speed.
  • A systematic accuracy better than 0.01 mm within the measurement volume (MV) was achieved.
  • Experimental results on 3D human body measurement confirmed the system's fast image acquisition capabilities.

Conclusions:

  • The wrapped phase and pseudorandom image method offers a viable solution for high-speed 3D measurement.
  • The developed system demonstrates high accuracy and efficiency, suitable for demanding applications.
  • This approach represents a significant advancement in rapid and precise 3D surface metrology.