Related Experiment Video
Updated: Jan 6, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
A configurable ion source for validating spaceflight-based thermal plasma measurement systems
Ellen Robertson1, Gregory Earle1, Jonathan Green1
1Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061, USA.
Abstract:
Thermal ion instruments are valuable for analyzing Earth's upper atmosphere. Prelaunch vacuum chamber testing of such instruments with a thermal ion source is often used to validate the performance of such instruments in a relevant environment, which is a prerequisite for a NASA flight. In this paper, we describe a new ion source that can be used for such tests, compare its performance with simulation results, and present an example of the utility for the source for validating the performance of an instrument.
More Related Videos
Related Concept Videos
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Atomic Emission Spectroscopy: Lab
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
Atomic Emission Spectroscopy: Instrumentation
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences

