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Updated: Jan 6, 2026

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
In situ analysis of catalyst composition during gold catalyzed GaAs nanowire growth
Carina B Maliakkal1,2, Daniel Jacobsson3,4, Marcus Tornberg3,5
1NanoLund, Lund University, 22100, Lund, Sweden. carina_babu.maliakkal@ftf.lth.se.
Abstract:
Semiconductor nanowires offer the opportunity to incorporate novel structures and functionality into electronic and optoelectronic devices. A clear understanding of the nanowire growth mechanism is essential for well-controlled growth of structures with desired properties, but the understanding is currently limited by a lack of empirical measurements of important parameters during growth, such as catalyst particle composition. However, this is difficult to accurately determine by investigating post-growth. We report direct in situ measurement of the catalyst composition during nanowire growth for the first time. We study Au-seeded GaAs nanowires inside an electron microscope as they grow and measure the catalyst composition using X-ray energy dispersive spectroscopy. The Ga content in the catalyst during growth increases with both temperature and Ga precursor flux.
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