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Distortion measurement of optical system using phase diffractive beam splitter.

Feng Wang, Zhiyu Zhang, Ruoqiu Wang

|November 6, 2019

Summary

This summary is machine-generated.

A novel phase diffractive beam splitter (DBS) method offers accurate and economical distortion measurement for large-aperture optical systems. This efficient technique enhances optical system analysis, particularly for aerial mapping applications.

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Area of Science:

Optical Engineering
Metrology

Background:

Traditional distortion measurement for large-aperture optical systems is inefficient, requiring time-consuming individual field-of-view measurements on precision rotating platforms.
Existing methods lack the speed and cost-effectiveness required for modern optical system analysis, especially for wide-angle applications.

Purpose of the Study:

To introduce a new, accurate, and economical method for measuring optical system distortion using a phase diffractive beam splitter (DBS).
To demonstrate the applicability of this method for large-aperture optical systems, including those used in aerial mapping.

Main Methods:

Development and application of a phase diffractive beam splitter (DBS) for distortion measurement.
Implementation of a high-precision calibration technique to determine the angular distribution of the DBS.
Comprehensive uncertainty analysis to validate the measurement methodology's accuracy.

Main Results:

High-precision measurements of focal length and distortion were successfully achieved with significant efficiency.
The proposed method demonstrated a high degree of accuracy and cost-effectiveness.
Low levels of error were confirmed through rigorous uncertainty analysis.

Conclusions:

The phase diffractive beam splitter (DBS) method provides an efficient, accurate, and economical solution for distortion measurement in large-aperture optical systems.
This technique is particularly well-suited for wide-angle systems used in applications like aerial mapping.
The method overcomes the limitations of traditional measurement techniques, offering a significant advancement in optical metrology.