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Updated: Jan 4, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
S C Schaub1, M A Shapiro1, R J Temkin1
1Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
Researchers measured multipactor discharge thresholds on dielectric surfaces at 110 GHz, finding significantly higher thresholds than at lower microwave frequencies. These findings align with theoretical predictions, improving understanding of high-frequency multipactor behavior.
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