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Related Experiment Video

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Insight into long-period pattern by depth sectioning using aberration-corrected scanning transmission electron

Chenzhi Song1, Jianlin Wang2, Jianping Sun2

  • 1Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China.

Ultramicroscopy
|November 14, 2019
PubMed
Summary

Long-period patterns in nanoscale materials can now be identified using depth sectioning with an aberration-corrected scanning transmission electron microscope (AC STEM). This method distinguishes moiré patterns from modulated structures in materials like Cu2-xSe nanoplates.

Keywords:
Cu(2-x)SeDepth sectioningLong-period patternMoiré patternScanning transmission electron microscopyStructural characterization

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Long-period patterns (LPPs) are common in nanoscale materials studied by transmission electron microscopy (TEM).
  • Distinguishing between modulated structures and moiré patterns, the two main LPP types, is challenging with conventional TEM (CTEM).

Purpose of the Study:

  • To determine the type of LPP observed in Cu2-xSe nanoplates.
  • To demonstrate the utility of depth sectioning with AC STEM for LPP characterization.

Main Methods:

  • Observation of LPPs in Cu2-xSe nanoplates using CTEM.
  • Depth sectioning using aberration-corrected scanning transmission electron microscopy (AC STEM) to acquire a series of atomic-resolution images.
  • Analysis of depth-series images to identify structural features.

Main Results:

  • An LPP in Cu2-xSe nanoplates was analyzed using AC STEM depth sectioning.
  • The LPP was identified as a moiré pattern resulting from two misoriented, stacked crystal flakes.
  • This confirms the applicability of the technique for differentiating LPP types.

Conclusions:

  • Depth sectioning with AC STEM is a powerful method for characterizing LPPs in nanomaterials.
  • This technique accurately differentiates moiré patterns from modulated structures.
  • The method shows potential for in-situ structural probing and 3D reconstruction of nanomaterials.