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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Development of analytical ultrafast transmission electron microscopy based on laser-driven Schottky field emission

Chunhui Zhu1, Dingguo Zheng2, Hong Wang2

  • 1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.

Ultramicroscopy
|November 19, 2019
PubMed

Keywords:
Field emissionSpatiotemporal resolutionUTEMUltrafast

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