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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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Smooth Surface Visual Imaging Method for Eliminating High Reflection Disturbance.

Wei Shao1, Kaibin Liu1, Yunqiu Shao1

  • 1Faculty of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, Xi'an 710048, Shanxi, China.

Sensors (Basel, Switzerland)
|November 20, 2019
PubMed
Summary
This summary is machine-generated.

This study introduces an adaptive illumination method using space-time modulation for precise part inspection. The technique effectively suppresses high light reflection and halo disturbance, improving defect detection accuracy.

Keywords:
feedback of CCDpixel-level spatiotemporal modulationtime-space ratiovisual imaging

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Area of Science:

  • Optics and Photonics
  • Computer Vision
  • Manufacturing Metrology

Background:

  • Visual imaging is crucial for detecting surface defects like bumps and scratches on precise, highly reflective parts.
  • High light reflection and halo effects from illumination significantly reduce the accuracy of automated visual inspection systems.
  • Existing methods struggle to provide uniform illumination for complex reflective surfaces, hindering precise defect identification.

Purpose of the Study:

  • To develop an adaptive illumination method for visual imaging systems to overcome challenges posed by highly reflective surfaces.
  • To enhance the accuracy and reliability of surface defect detection in the manufacturing of precise components.
  • To effectively mitigate issues of high light reflection and halo disturbance in visual inspection.

Main Methods:

  • Development of an adaptive illumination technique employing space-time modulation.
  • Utilization of a digital micro-mirror device (DMD) for pixel-level spatiotemporal illumination control.
  • Integration of charge-coupled device (CCD) illumination intensity feedback for automatic adjustment of the time-space ratio.

Main Results:

  • The proposed method achieves adaptive uniform illumination on highly reflective surfaces.
  • Significant suppression of high light reflection and halo disturbance was demonstrated.
  • Experimental results confirmed improved visibility and enhanced accuracy in visual imaging for defect detection.

Conclusions:

  • The adaptive illumination method based on space-time modulation effectively addresses challenges in inspecting reflective surfaces.
  • The system's ability to suppress glare and halo effects leads to more reliable and accurate defect detection.
  • This approach offers a promising solution for quality control in the manufacturing of precise parts requiring high-resolution visual inspection.