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Updated: Jan 3, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Published on: April 4, 2017
Demonstrating Quantum Coherence and Metrology that is Resilient to Transversal Noise
Chao Zhang1,2, Thomas R Bromley3, Yun-Feng Huang1,2
1Key Laboratory of Quantum Information, University of Science and Technology of China, CAS, Hefei, 230026, People's Republic of China.
Abstract:
Quantum systems can be exploited for disruptive technologies but in practice quantum features are fragile due to noisy environments. Quantum coherence, a fundamental such feature, is a basis-dependent property that is known to exhibit a resilience to certain types of Markovian noise. Yet, it is still unclear whether this resilience can be relevant in practical tasks. Here, we experimentally investigate the resilient effect of quantum coherence in a photonic Greenberger-Horne-Zeilinger state under Markovian bit-flip noise, and explore its applications in a noisy metrology scenario. In particular, using up to six-qubit probes, we demonstrate that the standard quantum limit can be outperformed under a transversal noise strength of approximately equal magnitude to the signal, providing experimental evidence of metrological advantage even in the presence of uncorrelated Markovian noise. This work highlights the important role of passive control in noisy quantum hardware, which can act as a low-overhead complement to more traditional approaches such as quantum error correction, thus impacting on the deployment of quantum technologies in real-world settings.
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