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Study on Micro Interfacial Charge Motion of Polyethylene Nanocomposite Based on Electrostatic Force Microscope.
Bai Han1,2,3, Jiaxin Chang1,2,3, Wei Song1,2,3
1Key Laboratory of Engineering Dielectrics and Its Application, Ministry of Education, Harbin University of Science and Technology, Harbin 150080, Heilongjiang, China.
Polymers
|December 11, 2019
Summary
The interface area in nano-dielectrics traps charges, forming a barrier that suppresses space charge injection and enhances dielectric properties. This microscale effect was observed using electrostatic force microscopy and verified with pulsed electro-acoustic tests.
Area of Science:
- Materials Science
- Electrical Engineering
- Nanotechnology
Background:
- Interface area is crucial for nano-dielectric properties, particularly in suppressing space charge.
- Understanding charge behavior at the microscale is essential for improving dielectric performance.
Purpose of the Study:
- To investigate the role of the interface area in charge movement and suppression at a microscopic level.
- To elucidate the mechanism by which interface areas affect space charge dynamics in nano-dielectrics.
Main Methods:
- Utilized gradual discharge under electrostatic force microscopy (EFM) to observe charge movement on pure LDPE and SiO2/LDPE nanocomposites.
- Employed pulsed electro-acoustic (PEA) short-circuited tests to analyze charge decay after injection.
- Correlated EFM and PEA test results to validate findings on charge decay trends.
Main Results:
- Observed charge movement towards and trapping within the interface area of SiO2/LDPE nanocomposites.
- Demonstrated that trapped charges at the interface act as a barrier, inhibiting further charge injection.
- Confirmed consistency between charge decay trends observed in EFM and PEA tests.
Conclusions:
- The interface area in nano-dielectrics plays a significant role in inhibiting space charge injection at the microscale.
- Charge trapping at the interface enhances overall dielectric performance.
- Findings provide experimental validation for theoretical research on space charge suppression in nano-dielectrics.

