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Industrial Calibration Procedure for Confocal Microscopes.

Alberto Mínguez Martínez^1,2, Jesús de Vicente Y Oliva^1,2

¹Laboratorio de Metrología y Metrotecnia (LMM), Escuela Técnica Superior de Ingenieros Industriales (ETSII), Universidad Politécnica de Madrid (UPM), c./José Gutiérrez Abascal, 2, 28006 Madrid, Spain

Materials (Basel, Switzerland)

|December 15, 2019

Summary

This study presents a simple calibration procedure for confocal microscopes, crucial for industrial dimensional measurements. The method ensures accurate submillimeter measurements using readily available reference standards.

Keywords:

calibration confocal microscopy coordinate metrology measurement quality assessment traceability uncertainty

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Area of Science:

Coordinate Metrology
Optical Instrumentation
Industrial Measurement

Background:

Coordinate metrology is essential for industrial dimensional measurements.
Optical, non-contact instruments are recommended for submillimeter measurements requiring traceability.
Confocal microscopes are widely used for such precise measurements.

Purpose of the Study:

To present a complete calibration procedure for confocal microscopes.
To design a simple calibration method suitable for industrial and workshop environments.
To ensure the procedure is based on easily accessible and calibratable reference material standards.

Main Methods:

Development of a simplified calibration procedure for confocal microscopes.
Utilization of classical reference material standards common in industrial dimensional laboratories.
Focus on traceability and ease of implementation in non-R&D settings.

Main Results:

A comprehensive calibration procedure for confocal microscopes has been established.
The procedure is designed for simplicity and applicability in industrial environments.
The method leverages readily available and calibratable reference standards.

Conclusions:

The presented calibration procedure offers a practical solution for industrial confocal microscopy.
The method ensures accurate dimensional measurements in the submillimeter range.
The procedure is adaptable for calibrating other 3D optical measurement instruments.