Optically modulated magnetic resonance of erbium implanted silicon

Mark A Hughes1, Heqing Li2, Nafsika Theodoropoulou2

  • 1Joule Physics Laboratory, School of Computing Science and Engineering, University of Salford, Salford, M5 4WT, UK. m.a.hughes@salford.ac.uk.

Scientific Reports
|December 15, 2019
PubMed
Summary

Researchers used optically modulated magnetic resonance (OMMR) to characterize erbium (Er) centers in silicon. This study provides the first measurement of crystal field splitting for Er in silicon, crucial for quantum and photonic applications.