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Updated: Jan 1, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral
Mikhail Svechnikov1, Nikolay Chkhalo1, Alexey Lopatin1
1Institute for Physics of Microstructures, Academicheskaya 7, Nizhny Novgorod 603087, Russian Federation.
Abstract:
In this work, the refractive index of beryllium in the photon energy range 20.4-250 eV was experimentally determined. The initial data include measurements of the transmittance of two free-standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films on a substrate. Measurements were carried out at the optics beamline of the BESSY II synchrotron radiation source. The absorption coefficient β was found directly from the transmission coefficient of the films, and the real part of the polarizability δ was calculated from the Kramers-Kronig relations. A comparison is carried out with results obtained 20 years ago at the ALS synchrotron using a similar methodology.

