Polarization-resolved dual-view holographic system for 3D inspection of scattering particles

A novel dual-view polarization-resolved pulsed holographic system for particle measurements is presented. Both dual-view configuration and polarization-resolved registration are well suited for particle holography. Dual-view registration improves the accuracy in the detection of 3D position and velocities, and polarization-resolved registration provides polarization information about individual particles. The necessary calibrations are presented, and aberrations are compensated for by mapping the positions in the two views to positions in a global coordinate system. The system is demonstrated on a sample consisting of 7 μm spherical polystyrene particles dissolved in water in a cuvette. The system is tested with different polarizations of the illumination. It is found that the dual view improves the accuracy significantly in particle tracking. It is also found that by having polarization-resolved holograms, it is possible to separate naturally occurring sub-micrometer particles from the larger, 7 μm seeding particles.