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Photon number measurement using heterodyne method for a detector's quantum efficiency determination based on
Applied Optics
|December 25, 2019
Summary
A new heterodyne-based method improves signal-to-noise ratio (SNR) for characterizing single photon detectors. This technique enhances detection efficiency measurements, crucial for quantum technologies like quantum computers.
Area of Science:
- Quantum Information Science
- Quantum Optics
- Metrology
Background:
- Accurate characterization of single photon detectors is essential for advancing quantum information technologies, including quantum computers and quantum key distribution.
- Detection efficiency is a critical parameter for single photon detectors.
- The reference-free twin-photon-based Klyshko method is a standard technique for measuring detection efficiency, but its signal-to-noise ratio (SNR) can be limited by noise.
Purpose of the Study:
- To address the low signal-to-noise ratio (SNR) encountered in standard Klyshko method measurements for single photon detector characterization.
- To propose and validate a novel heterodyne-based method for enhancing SNR in detection efficiency measurements.
Main Methods:
- Implementation of a heterodyne detection scheme within the standard Klyshko measurement setup.
- Introduction of modulation at a higher frequency to facilitate averaging, circumventing low-frequency 'random telegraph signal' noise.
- Numerical simulation and experimental validation of the proposed heterodyne-based method.
Main Results:
- The proposed heterodyne-based method demonstrated a significant improvement in signal-to-noise ratio (SNR) compared to simple averaging techniques.
- Numerical simulations indicated a 14-fold increase in SNR.
- Experimental results confirmed the 14-fold SNR improvement, validating the effectiveness of the new method.
Conclusions:
- The heterodyne-based method offers a robust solution for improving SNR in single photon detector efficiency measurements using the Klyshko technique.
- This advancement is vital for the precise parameter characterization required for developing sophisticated quantum informational components.
- The validated method provides a pathway to more reliable and accurate measurements in quantum metrology.

