An electrically induced probe of the modes of a plasmonic multilayer stack

A new single-image acquisition technique for the determination of the dispersion relation of the propagating modes of a plasmonic multilayer stack is introduced. This technique is based on an electrically-driven, spectrally broad excitation source which is nanoscale in size: the inelastic electron tunnel current between the tip of a scanning tunneling microscope (STM) and the sample. The resulting light from the excited modes of the system is collected in transmission using a microscope objective. The energy-momentum dispersion relation of the excited optical modes is then determined from the angle-resolved optical spectrum of the collected light. Experimental and theoretical results are obtained for metal-insulator-metal (MIM) stacks consisting of a silicon oxide layer (70, 190 or 310 nm thick) between two gold films (each with a thickness of 30 nm). The broadband characterization of hybrid plasmonic-photonic transverse magnetic (TM) modes involved in an avoided crossing is demonstrated and the advantages of this new technique over optical reflectivity measurements are evaluated.