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3D shape measurement of translucent objects based on Fourier single-pixel imaging in projector-camera system
Optics Express
|December 28, 2019
Summary
This study introduces a new 3D shape measurement method for translucent objects using Fourier single-pixel imaging (FSI). The technique accurately separates direct light from subsurface scattering, improving 3D shape recovery for challenging materials.
Area of Science:
- Optics and Photonics
- Computer Vision
- Metrology
Background:
- Structured light 3D shape measurement is widely used but struggles with translucent objects due to subsurface scattering.
- Global illumination effects, like scattering, introduce errors in conventional 3D shape recovery.
- Accurate 3D reconstruction of translucent objects remains a significant challenge in optical metrology.
Purpose of the Study:
- To develop a novel 3D shape measurement method for translucent objects.
- To address the limitations of structured light techniques when applied to scattering materials.
- To improve the accuracy and feasibility of 3D shape measurement for translucent objects.
Main Methods:
- Proposed a 3D shape measurement method based on Fourier single-pixel imaging (FSI).
- Utilized stereo matching to reconstruct 3D shapes from separated direct illumination light.
- Separated direct illumination light from subsurface scattering light using the FSI technique.
Main Results:
- Successfully separated direct illumination light from subsurface scattering light.
- Demonstrated the feasibility and accuracy of the proposed FSI-based method.
- Provided qualitative and quantitative results validating the method's performance.
Conclusions:
- The proposed Fourier single-pixel imaging method effectively measures the 3D shapes of translucent objects.
- The technique overcomes limitations of traditional structured light by separating scattering effects.
- This advancement offers a more accurate approach for 3D shape measurement of challenging translucent materials.

