Defects in Highly Anisotropic Transition-Metal Dichalcogenide PdSe2

Mingming Fu1,2, Liangbo Liang2, Qiang Zou2

  • 1Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics , Xiamen University , Xiamen , Fujian Province 361005 , P.R. China.

Summary

This study reveals how scanning tunneling microscopy (STM) can image sublayer defects in PdSe2. Tip gating reveals charged vacancy defects, making deep defects visible non-destructively.