Atomic Force Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
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Updated: Jan 1, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Yingxu Zhang1,2, Yingzi Li2,3, Zihang Song2,3
1School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China.
A new Bayesian compressed sensing method effectively removes impulse noise from atomic force microscopy (AFM) images. This approach preserves image details and is robust to varying noise levels.
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