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Correction approach of detector backlighting in radiography
Ala'a M Al-Falahat1, Andreas Kupsch2, Manfred P Hentschel3
1Helmholtz-Zentrum Berlin, Hahn-Meitner-Platz 1, Berlin 14109, Germany.
The Review of Scientific Instruments
|January 3, 2020
Summary
Detector backlighting in radiography can reduce material attenuation measurements. This study introduces a correction method based on X-ray data to improve transmission imaging accuracy.
Area of Science:
- Radiography and Imaging Science
- Materials Science and Engineering
Background:
- Deficient transmission imaging in radiography can arise from detector backlighting caused by light or radiation scattering.
- While intensity mismatches from backlighting may not significantly impact high-resolution contrast, their long-range effect can lead to disregarded reductions in attenuation levels.
Purpose of the Study:
- To develop a first-order correction procedure for detector backlighting in radiography.
- To quantify the impact of backlighting on material attenuation values.
Main Methods:
- Utilized X-ray observations and an empirical formalism to model detector backlighting.
- Developed a backlighting factor as a function of relative detector coverage by the sample projection.
- Analyzed different cases of sample transmission under varying backlight factors and detector coverage.
Main Results:
- The additional intensity from backlighting can significantly affect material attenuation values, by up to 10%.
- The proposed correction procedure is effective across different transmission scenarios and detector coverages.
Conclusions:
- The developed procedure offers a straightforward method for correcting detector backlighting in X-ray and neutron transmission imaging.
- Accurate attenuation measurements are crucial for material characterization and analysis in radiography.
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