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Updated: Dec 31, 2025

Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System

Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System

Published on: July 18, 2015

The chopped moving photocarrier grating technique.

Leonardo Kopprio¹, Federico Ventosinos¹, Javier Schmidt¹

¹Instituto de Física del Litoral (IFIS-Litoral), CONICET-UNL, Güemes 3450, S3000GLN Santa Fe, Argentina.

The Review of Scientific Instruments

|January 3, 2020

Summary

The new Chopped Moving photocarrier Grating (CMG) technique enhances semiconductor analysis by using AC signals for improved noise removal. This method offers superior performance for measuring photocarrier drift mobilities and recombination lifetimes, especially at low signal levels.

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Last Updated: Dec 31, 2025

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Area of Science:

Semiconductor physics
Photoconductivity
Charge transport phenomena

Background:

The Moving photocarrier Grating Technique (MGT) determines photocarrier mobilities and recombination lifetimes.
A limitation of MGT is its low signal-to-noise ratio, particularly at low temperatures or light intensities.
This noise can mask critical measurements.

Purpose of the Study:

To introduce an AC version of the MGT, termed the Chopped Moving photocarrier Grating (CMG) technique.
To enhance signal-to-noise ratio for more robust semiconductor characterization.
To validate the CMG technique against the standard MGT.

Main Methods:

Implementing an AC MGT by chopping the weak beam in the standard configuration.
Utilizing a lock-in amplifier for precise AC signal measurement and noise reduction.
Developing a theoretical expression for CMG current density based on a multiple-trapping model.

Main Results:

Numerical simulations using hydrogenated amorphous silicon parameters confirm the equivalence of CMG and MGT at low chopping frequencies.
Experimental validation on an undoped hydrogenated amorphous silicon sample demonstrates CMG's effectiveness.
CMG shows superior performance in low signal level measurements compared to the DC MGT.

Conclusions:

The Chopped Moving photocarrier Grating (CMG) technique significantly improves signal-to-noise ratio for semiconductor characterization.
CMG offers a more reliable method for determining photocarrier drift mobilities and recombination lifetimes, especially under challenging low signal conditions.
This advancement provides a valuable tool for studying photoconductive materials.