Development of high-speed ion conductance microscopy

Shinji Watanabe1, Satoko Kitazawa2, Linhao Sun1

  • 1WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan.

Summary

High-speed Scanning Ion Conductance Microscopy (SICM) achieves 100x faster imaging for biological samples. This breakthrough enables detailed surface topography analysis at high temporal and spatial resolutions without probe-sample contact.