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Extracting the shape of nanometric field emitters
Daniel Beinke1, Felicitas Bürger2, Helena Solodenko1
1Chair of Materials Physics, Institute for Materials Science, University of Stuttgart, Heisenbergstr. 3, D-70569 Stuttgart, Germany. guido.schmitz@imw.uni-stuttgart.de.
Nanoscale
|January 22, 2020
Summary
Atom probe tomography reconstruction is improved by extracting the real emitter shape from detector data, overcoming distortions caused by assuming a hemispherical tip. This method accurately reconstructs complex shapes from large atom datasets.
Area of Science:
- Materials Science
- Nanotechnology
- Analytical Chemistry
Background:
- Atom probe tomography (APT) enables high-resolution nanoanalysis using needle-shaped samples (field emitters).
- Conventional APT reconstruction assumes a hemispherical emitter apex, which can introduce significant distortions.
- Accurate reconstruction is crucial for reliable nanoscale material characterization.
Purpose of the Study:
- To develop a novel method for APT reconstruction that accounts for the real, non-hemispherical shape of field emitters.
- To improve the accuracy and reduce distortions in APT volume reconstruction.
- To enable the analysis of complex emitter geometries without prior shape assumptions.
Main Methods:
- Extracting the actual emitter shape from the event density distribution on the 2D detector.
- Deriving the necessary mathematical framework for shape extraction and reconstruction.
- Validating the method using simulated and experimental APT data with complex tip shapes.
Main Results:
- Demonstrated a method to accurately determine emitter shape directly from detector event data.
- Successfully reconstructed complex tip shapes, overcoming limitations of the hemispherical apex assumption.
- The method shows computational feasibility for large atom datasets (hundreds of millions of atoms).
Conclusions:
- The developed method significantly enhances the accuracy of atom probe tomography reconstruction.
- It removes the need for restrictive assumptions about emitter geometry, enabling analysis of diverse nanoscale structures.
- This advancement is vital for precise nanoanalysis in materials science and nanotechnology.
