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Effect of Electron Injection Layer on the Parasitic Recombination at the Hole Transport Layer/Quantum Dot Interface

Da-Young Park1, Jae-Hoon Lim1, Bum-Joo Lee2

  • 1Department of Materials Engineering, Soonchunhyang University, Asan, Chungnam 31538, Korea.

Journal of Nanoscience and Nanotechnology
|January 24, 2020
PubMed

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