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Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM
Ana I Gómez-Varela1,2, Dimitar R Stamov3, Adelaide Miranda4
1International Iberian Nanotechnology Laboratory, Avenida Mestre José Veiga s/n, Braga, Portugal. anaisabel.gomez@usc.es.
Scientific Reports
|January 26, 2020
Summary
This study introduces a novel hardware setup for simultaneous super-resolution fluorescence and atomic force microscopy. This breakthrough allows for unprecedented correlated imaging of cellular structures and events.
Area of Science:
- Cellular Biology
- Microscopy
- Biophysics
Background:
- Correlating data from diverse microscopy techniques can reveal novel cellular signaling events.
- Previous simultaneous imaging approaches were limited by the Abbe diffraction limit in fluorescence microscopy.
Purpose of the Study:
- To develop and demonstrate a hardware setup for simultaneous, co-localized imaging using super-resolution fluorescence microscopy and atomic force microscopy.
- To overcome the spatial resolution limitations of traditional fluorescence microscopy.
Main Methods:
- Integration of a hardware setup for simultaneous far-field super-resolution fluorescence microscopy and atomic force microscopy.
- System performance validation using sub-resolution fluorescent beads.
- Application to human bone osteosarcoma epithelial cells expressing N-terminally EGFP-tagged MCT1.
Main Results:
- Achieved simultaneous co-localized imaging with spatial correlation between super-resolution fluorescence and atomic force microscopy.
- Demonstrated system capability beyond the Abbe diffraction limit.
- Successfully imaged plasma membrane transporter 1 (MCT1) in human cells.
Conclusions:
- The developed hardware enables unprecedented correlated imaging, advancing cellular biology research.
- This technique overcomes previous resolution limitations, opening new avenues for studying cellular signaling.
- The system provides a powerful tool for high-resolution, multi-modal cellular imaging.
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