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Updated: Dec 29, 2025
Fiber Optic Distributed Sensors for High-resolution Temperature Field Mapping
Published on: November 7, 2016
Optical Fiber FP Sensor for Simultaneous Measurement of Refractive Index and Temperature Based on the Empirical Mode
Everardo Vargas-Rodriguez1, Ana Dinora Guzman-Chavez1, Roberto Baeza-Serrato1
1Departamento de Estudios Multidisciplinarios, División de Ingenierías, Campus Irapuato-Salamanca, Universidad de Guanajuato, Av. Universidad s/n, Col. Yacatitas, Yuriria, Guanajuato C.P. 38940, Mexico.
This study introduces a novel dual sensor for measuring refractive index and temperature using an interferometric system and the empirical mode decomposition (EMD) algorithm. The EMD method effectively analyzes complex spectra, enabling accurate extraction of both parameters and expanding measurement ranges.
Area of Science:
- Optical Engineering
- Sensor Technology
- Signal Processing
Background:
- Interferometric sensors are crucial for precise measurements.
- Analyzing complex spectral data from optical filters presents challenges.
- Existing methods may have limitations in dynamic range and data interpretation.
Purpose of the Study:
- To develop a dual sensor for simultaneous refractive index and temperature measurement.
- To apply the empirical mode decomposition (EMD) algorithm for spectral analysis.
- To enhance the dynamic measurement ranges and understanding of interferometric sensors.
Main Methods:
- Fabrication of a three-layer interferometric filter on an optical fiber tip.
- Utilizing the empirical mode decomposition (EMD) algorithm to analyze reflection spectra.
- Decomposition of spectra into intrinsic mode functions (IMFs) for parameter extraction.
Main Results:
- Successful decomposition of experimental spectra using EMD.
- Accurate extraction of both refractive index and temperature from the decomposed IMFs.
- Demonstrated widening of dynamic measurement ranges for both variables.
Conclusions:
- The EMD algorithm offers a robust method for analyzing complex interferometric spectra.
- The proposed dual sensor and EMD methodology provide a powerful tool for simultaneous measurements.
- This approach validates the mathematical model and enhances interferometric sensor capabilities.
