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Dynamic hydration effects in an electron microscope cold stage.

M K Lamvik1, S D Davilla

  • 1Department of Anatomy, Duke University Medical Center, Durham, North Carolina 27710.

Journal of Electron Microscopy Technique
|April 1, 1988
PubMed
Summary
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Residual water in electron microscopy can affect specimen mass loss measurements. Condensed water can either enhance mass loss through etching or mask it via adsorption, impacting data interpretation.

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Electron Microscopy

Background:

  • Residual water is a common contaminant in electron microscopes, even without hydrated specimens.
  • Water layers can significantly influence radiation-induced mass loss in thin films.
  • Understanding water's role is crucial for accurate mass thickness measurements.

Purpose of the Study:

  • To investigate the effect of condensed water on radiation-induced mass loss in collodion films.
  • To analyze how water adsorption and desorption dynamics impact apparent mass loss rates.
  • To determine the influence of water on specimen integrity during electron microscopy analysis.

Main Methods:

  • Measurements of mass thickness of thin collodion film specimens at low temperatures.

Related Experiment Videos

  • Observation of mass loss rates under electron beam irradiation.
  • Analysis of water adsorption and desorption phenomena on specimen surfaces.
  • Main Results:

    • Condensed water can enhance specimen mass loss via etching.
    • Water adsorption can mask true mass loss, leading to underestimation.
    • Water can be desorbed from the microscope or grid by radiation.
    • Observed mass loss rates may not reflect ultimate specimen damage.

    Conclusions:

    • Interpreting mass thickness measurements in the presence of water requires caution.
    • Lowest stage temperatures do not always ensure optimal observation conditions.
    • The dynamic interaction of water with specimens under electron irradiation is complex and affects results.